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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Dynamic MTF analysis and calculation of aerial camera
Liao, Jingyu, Gao, Xiaodong, Jiang, Ya-Dong, Kippelen, Bernard, Yu, JunshengVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.866825
File:
PDF, 390 KB
english, 2010