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Preferential suppression of Auger energy backflow by separation of Er ions from carriers with a thin oxide interlayer in Er-doped porous silicon
T. Kimura, H. Isshiki, T. Ishida, T. Shimizu, S. Ide, R. Saito, S. YugoVolume:
102-103
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0022-2313(02)00481-7
File:
PDF, 202 KB
english, 2003