Hard X-ray beam damage study of monolayer Ni islands using SX-STM
Shirato, Nozomi, Cummings, Marvin, Kersell, Heath, Li, Yang, Miller, Dean, Rosenmann, Daniel, Hla, Saw-Wai, Rose, VolkerVolume:
1754
Year:
2015
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2015.114
File:
PDF, 635 KB
english, 2015