A Study on the Degradation of In-Ga–Zn-O...

IEEE Electron Device Letters 2015 / 7 Vol. 36; Iss. 7

A Study on the Degradation of In-Ga–Zn-O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution

Choi, Sungju, Kim, Hyeongjung, Jo, Chunhyung, Kim, Hyun-Suk, Choi, Sung-Jin, Kim, Dong Myong, Park, Jozeph, Kim, Dae Hwan
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2015.2438333
Date:
July, 2015
File:
PDF, 139 KB
english, 2015
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