Study of Surface and Interface Roughness of GaN-Based Films...

Journal of Electronic Materials 2015 / 10 Vol. 44; Iss. 10

Study of Surface and Interface Roughness of GaN-Based Films Using Spectral Reflectance Measurements

Benzarti, Z., Khelifi, M., Halidou, I., El Jani, B.
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Volume:
44
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-3855-9
Date:
October, 2015
File:
PDF, 1.44 MB
english, 2015
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