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SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Optical Design and Engineering II - Tolerance analysis of optical systems containing sampling devices
Curatu, Costin, Curatu, George, Mazuray, Laurent, Wartmann, RolfVolume:
5962
Year:
2005
Language:
english
DOI:
10.1117/12.625033
File:
PDF, 461 KB
english, 2005