Conducting-Atomic Force Microscopy Investigation of the...

Electrochemical and Solid-State Letters 2001 Vol. 4; Iss. 9

Conducting-Atomic Force Microscopy Investigation of the Local Electrical Characteristics of a Ti/TiO[sub 2]/Pt Anode

Macpherson, Julie V., de Mussy, Jean-Paul Gueneau, Delplancke, Jean-Luc
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Volume:
4
Year:
2001
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.1388195
File:
PDF, 641 KB
english, 2001
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