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Linear and nonlinear FEL–SEW spectroscopic characterization of nanometer-thick films
E.V. Alieva, G. Beitel, L.A. Kuzik, A.A. Sigarev, V.A. Yakovlev, G.N. Zhizhin, A.F.G. van der Meer, M.J. van der WielVolume:
449
Year:
1998
Language:
english
Pages:
11
DOI:
10.1016/s0022-2860(98)00456-6
File:
PDF, 243 KB
english, 1998