Standardisation of near-IR spectrometers using artificial neural networks
L. Duponchel, C. Ruckebusch, J.P. Huvenne, P. LegrandVolume:
480-481
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0022-2860(98)00781-9
File:
PDF, 140 KB
english, 1999