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Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD
Ktifa, S., Ghrib, M., Saadallah, F., Ezzaouia, H., Yacoubi, N.Volume:
2012
Year:
2012
Language:
english
Journal:
International Journal of Photoenergy
DOI:
10.1155/2012/418924
File:
PDF, 1.26 MB
english, 2012