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RANdom sample consensus (RANSAC) algorithm for enhancing overlapped etched track counting
Kim, Yoon Sang, Ghergherehchi, Mitra, Kim, Seung Yeol, Afarideh, HosseinVolume:
9
Language:
english
Journal:
IET Image Processing
DOI:
10.1049/iet-ipr.2013.0885
Date:
February, 2015
File:
PDF, 855 KB
english, 2015