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Self-generated microcracks in an ultra-thin AlN/GaN superlattice interlayer and their influences on the GaN epilayer grown on Si(110) substrates by metal–organic chemical vapor deposition
Shen, Xu-Qiang, Takahashi, Tokio, Matsuhata, Hirofumi, Ide, Toshihide, Shimizu, MitsuakiVolume:
17
Year:
2015
Language:
english
Journal:
CrystEngComm
DOI:
10.1039/c5ce00929d
File:
PDF, 3.54 MB
english, 2015