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Efficient testing and diagnosis of faulty power switches in SOCs
Goel, S.K., Meijer, M., de Gyvez, J. PinedaVolume:
1
Year:
2007
Language:
english
Journal:
IET Computers & Digital Techniques
DOI:
10.1049/iet-cdt:20060147
File:
PDF, 539 KB
english, 2007