Arithmetic module-based built-in self test architecture for two-pattern testing
Voyiatzis, I., Efstathiou, C., Antonopoulou, H., Milidonis, A.Volume:
6
Year:
2012
Language:
english
Journal:
IET Computers & Digital Techniques
DOI:
10.1049/iet-cdt.2010.0061
File:
PDF, 348 KB
english, 2012