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A noise detection scheme with 10 mK noise temperature resolution for semiconductor single electron tunneling devices
Glattli, D. C., Jacques, P., Kumar, A., Pari, P., Saminadayar, L.Volume:
81
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.365332
File:
PDF, 512 KB
english, 1997