Using X-mode L, R and O-mode reflectometry cutoffs to...

Review of Scientific Instruments 2014 / 11 Vol. 85; Iss. 11

Using X-mode L, R and O-mode reflectometry cutoffs to measure scrape-off-layer density profiles for upgraded ORNL reflectometer on NSTX-Ua)

Lau, C., Wilgen, J. B., Caughman, J. B., Hanson, G. R., Hosea, J., Perkins, R., Ryan, P. M., Taylor, G.
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Volume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4889739
Date:
November, 2014
File:
PDF, 511 KB
english, 2014
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