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On the length scale of cyclic strain localization in fine-grained copper films
Zhang, B., Sun, K.H., Liu, Y., Zhang, G.P.Volume:
90
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/09500830903451868
Date:
January, 2010
File:
PDF, 1.07 MB
english, 2010