Characterization of a-Si: H and a-Sic: H: F heterojunctions...

Philosophical Magazine B 1989 / 07 Vol. 60; Iss. 1

Characterization of a-Si: H and a-Sic: H: F heterojunctions by in situ X-ray photoelectron spectroscopy

Matsuzaki, Yoshio, Ohtaki, Teruhiko, Fujishima, Motoi, Yoshida, Yasuhiko, Kawasaki, Masashi, Koinuma, Hideomi
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Volume:
60
Language:
english
Journal:
Philosophical Magazine Part B
DOI:
10.1080/13642818908228812
Date:
July, 1989
File:
PDF, 667 KB
english, 1989
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