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Mössbauer effect and X-ray diffraction investigation of Si–Fe thin films
McGraw, J. D., Fleischauer, M. D., Dahn, J. R., Dunlap, R. A.Volume:
86
Language:
english
Journal:
Philosophical Magazine
DOI:
10.1080/14786430600764864
Date:
November, 2006
File:
PDF, 2.86 MB
english, 2006