Optical characterization and determination of conduction...

Semiconductor Science and Technology 2004 / 12 Vol. 19; Iss. 12

Optical characterization and determination of conduction band offset of type-II GaAsSb/InGaAs QW

Ryu, Sang-Wan, Dapkus, P D
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Volume:
19
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/19/12/007
Date:
December, 2004
File:
PDF, 112 KB
english, 2004
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