Influence of firing process quality on dielectric constant...

Microelectronics International 2014 / 07 Vol. 31; Iss. 3

Influence of firing process quality on dielectric constant of microwave LTCC substrates

Agata Skwarek, Dr, Barteczka, Beata, Slobodzian, Piotr, Dabrowski, Arkadiusz, Golonka, Leszek
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
31
Language:
english
Journal:
Microelectronics International
DOI:
10.1108/mi-11-2013-0067
Date:
July, 2014
File:
PDF, 383 KB
english, 2014
Conversion to is in progress
Conversion to is failed