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[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Impact of gate shapes on single event transients
Zhao Xinyuan,, Wang liang,, Yue Suge,Year:
2014
Language:
english
DOI:
10.1109/edssc.2014.7061074
File:
PDF, 428 KB
english, 2014