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[IEEE 2014 22nd International Conference on Pattern Recognition (ICPR) - Stockholm, Sweden (2014.8.24-2014.8.28)] 2014 22nd International Conference on Pattern Recognition - A 3D Approach to Facial Landmarks: Detection, Refinement, and Tracking
Cech, Jan, Franc, Vojtech, Matas, JiriYear:
2014
Language:
english
DOI:
10.1109/icpr.2014.378
File:
PDF, 1.18 MB
english, 2014