[IEEE 2014 22nd International Conference on Pattern...

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[IEEE 2014 22nd International Conference on Pattern Recognition (ICPR) - Stockholm, Sweden (2014.8.24-2014.8.28)] 2014 22nd International Conference on Pattern Recognition - Low Computation Face Verification Using Class Center Analysis

Zhang, Xinzi, Wang, Jinjun, Gong, Yihong, Zhang, Shizhou, Zhang, Shun
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Year:
2014
Language:
english
DOI:
10.1109/icpr.2014.777
File:
PDF, 875 KB
english, 2014
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