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[IEEE 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - South Lake Tahoe, CA, USA (2014.10.12-2014.10.16)] 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - BTI reliability of high-mobility channel devices: SiGe, Ge and InGaAs
Franco, J., Kaczer, B., Roussel, J., Cho, M., Grasser, T., Mitard, J., Arimura, H., Witters, L., Cott, D., Waldron, N., Zhou, D., Vais, A., Lin, D., Alian, A., Pourghaderi, M. A., Martens, K., SionckeYear:
2014
Language:
english
DOI:
10.1109/iirw.2014.7049510
File:
PDF, 791 KB
english, 2014