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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Proton irradiation-induced traps causing VT instabilities and RF degradation in GaN HEMTs
Sasikumar, A., Zhang, Z., Kumar, P., Zhang, E. X., Fleetwood, D. M., Schrimpf, R. D., Saunier, P., Lee, C., Ringel, S. A., Arehart, A. R.Year:
2015
Language:
english
DOI:
10.1109/irps.2015.7112688
File:
PDF, 313 KB
english, 2015