[IEEE 2014 IEEE International Symposium on Electromagnetic...

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[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - The impact of near-field scanning size on the accuracy of far-field estimation

Ren, Xiao, Maheshwari, Pratik, Zhang, Yao-jiang, Khilkevich, Victor, Fan, Jun, Zhou, Yan, Bai, Yadong, Yu, Xuequan
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Year:
2014
Language:
english
DOI:
10.1109/isemc.2014.6899038
File:
PDF, 1.38 MB
english, 2014
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