Degradation Mechanisms of Mid-Power White-Light LEDs Under High-Temperature–Humidity Conditions
Huang, Jianlin, Golubovic, Dusan S, Koh, Sau, Yang, Daoguo, Li, Xiupeng, Fan, X. J., Zhang, G. Q.Volume:
15
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2015.2418345
Date:
June, 2015
File:
PDF, 1.47 MB
english, 2015