Synergistic Effect of Ionization and Displacement Damage in...

IEEE Transactions on Nuclear Science 2015 / 6 Vol. 62; Iss. 3

Synergistic Effect of Ionization and Displacement Damage in NPN Transistors Caused by Protons With Various Energies

Li, Xingji, Liu, Chaoming, Yang, Jianqun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2415805
Date:
June, 2015
File:
PDF, 915 KB
english, 2015
Conversion to is in progress
Conversion to is failed