[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - Analytical approach to consider Gaussian junction profiles in compact models of tunnel-FETs
Graef, Michael, Hain, Franziska, Hosenfeld, Fabian, Iniguez, Benjamin, Kloes, AlexanderYear:
2015
Language:
english
DOI:
10.1109/ulis.2015.7063751
File:
PDF, 1.17 MB
english, 2015