SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, United States (Monday 20 April 2015)] Infrared Technology and Applications XLI - Confocal Raman spectroscopy and AFM for evaluation of sidewalls in type II superlattice FPAs
Andresen, Bjørn F., Fulop, Gabor F., Hanson, Charles M., Norton, Paul R., Rotter, T. J., Busani, T., Rathi, P., Jaeckel, F., Reyes, P. A., Malloy, K. J., Ukhanov, A. A., Plis, E., Krishna, S., Jaime-VVolume:
9451
Year:
2015
Language:
english
DOI:
10.1117/12.2178162
File:
PDF, 682 KB
english, 2015