SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Optical Manufacturing and Testing - Figure metrology of deep general aspherics using a conventional interferometer with CGH null
Arnold, Steven M., Maxey, L. Curt, Rogers, JoEllen, Yoder, Robert C., Doherty, Victor J., Stahl, H. PhilipVolume:
2536
Year:
1995
Language:
english
DOI:
10.1117/12.218413
File:
PDF, 960 KB
english, 1995