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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 13 April 2015)] Advances in X-ray Free-Electron Lasers Instrumentation III - A single-shot, high-repetition rate scheme for electro-optic detection of short pulses
Biedron, Sandra G., Roussel, E., Evain, C., Le Parquier, M., Szwaj, C., Bielawski, S., Manceron, L., Brubach, J.-B., Tordeux, M.-A., Ricaud, J.-P., Cassinari, L., Labat, M., Couprie, M.-E., Roy, P.Volume:
9512
Year:
2015
Language:
english
DOI:
10.1117/12.2184972
File:
PDF, 490 KB
english, 2015