SPIE Proceedings [SPIE International Conference on Applied Optical Metrology - Balatonfured, Hungary (Monday 8 June 1998)] International Conference on Applied Optical Metrology - Diffractive optical element in materials testing
Silvennoinen, Raimo V. J., Peiponen, Kai-Erik, Rastogi, Pramod K., Gyimesi, FerencVolume:
3407
Year:
1998
Language:
english
DOI:
10.1117/12.323302
File:
PDF, 840 KB
english, 1998