![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose, CA (Sunday 28 January 2007)] Machine Vision Applications in Industrial Inspection XV - Basic scanner for parallepipedic manufactured pieces
Hrimech, Hamid, Pavéglio, Jean, Marzani, Franck, Voisin, Yvon, Meriaudeau, Fabrice, Niel, Kurt S.Volume:
6503
Year:
2007
Language:
english
DOI:
10.1117/12.704221
File:
PDF, 472 KB
english, 2007