Effects of Annealing on Oxygen Depth Profiles and Chemical...

Effects of Annealing on Oxygen Depth Profiles and Chemical Etching Rates of Thermally Grown Silicon Oxides

Watanabe, Yoshio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
145
Year:
1998
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1838456
File:
PDF, 372 KB
english, 1998
Conversion to is in progress
Conversion to is failed