[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Investigating Electronic and Chemical Properties of Ge/GeOxNy/HfO2 Gate Stacks : High-Resolution Photoelectron Spectroscopy Using Synchrotron Radiation
Renault, Olivier J., Martinez, Eugénie, Fourdrinier, Lionel, Clavelier, Laurent, Barrett, Nick, Le Royer, Cyrille, Crotti, CorradoVolume:
3
Year:
2006
Language:
english
DOI:
10.1149/1.2356298
File:
PDF, 210 KB
english, 2006