Asymmetric Negative Bias Temperature Instability...

Journal of The Electrochemical Society 2010 Vol. 157; Iss. 1

Asymmetric Negative Bias Temperature Instability Degradation of Poly-Si TFTs under Static Stress

Weng, Chi-Feng, Chang, Ting-Chang, Jian, Fu-Yen, Chen, Shih-Ching, Lu, Jin, Lu, I-Ching
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Volume:
157
Year:
2010
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.3244596
File:
PDF, 695 KB
english, 2010
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