Effect of Charge Trapping∕Detrapping on Threshold Voltage Shift of IGZO TFTs under AC Bias Stress
Kim, Sun-Jae, Lee, Soo-Yeon, Lee, Young Wook, Kuk, Seung-Hee, Kwon, Jang-Yeon, Han, Min-KooVolume:
15
Year:
2012
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/2.026204esl
File:
PDF, 274 KB
english, 2012