Characterization of Series Resistance and Mobility...

Active and Passive Electronic Components 2011 Vol. 2011

Characterization of Series Resistance and Mobility Degradation Parameter and Optimizing Choice of Oxide Thickness in Thin Oxide N-Channel MOSFET

Maouhoub, Noureddine, Rais, Khalid
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Volume:
2011
Year:
2011
Language:
english
Journal:
Active and Passive Electronic Components
DOI:
10.1155/2011/713129
File:
PDF, 206 KB
english, 2011
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