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Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films
C.-H Lee, K.-L Yu, J.C.A Huang, G FelcherVolume:
60
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0022-3697(99)00151-1
File:
PDF, 98 KB
english, 1999