Statistical fitting analysis of Stark-broadened optically...

Statistical fitting analysis of Stark-broadened optically thick Ar II spectra measured in ion beam transport experiments

Hyun-Kyung Chung, David H. Cohen, Joseph J. MacFarlane, James E. Bailey, Ping Wang, Gregory A. Moses
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Volume:
65
Year:
2000
Language:
english
Pages:
15
DOI:
10.1016/s0022-4073(99)00062-x
File:
PDF, 401 KB
english, 2000
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