Temperature Dependence of 1/f Noise and Electrical...

MRS Proceedings 2013 / 1 Vol. 1536

Temperature Dependence of 1/f Noise and Electrical Conductivity Measurements on p-type a-Si:H Devices

Lopes, V. C., Hanson, E., Whitfield, D., Shrestha, K., Littler, C. L., Syllaios, A. J.
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Volume:
1536
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2013.751
Date:
January, 2013
File:
PDF, 641 KB
english, 2013
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