Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, A, Ubar, R, Tsertov, A, Brik, MVolume:
63
Year:
2014
Language:
english
Journal:
Proceedings of the Estonian Academy of Sciences
DOI:
10.3176/proc.2014.1.08
File:
PDF, 990 KB
english, 2014