Application of bimaterial interface corner failure...

Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds

Paul E.W. Labossiere, Martin L. Dunn, Shawn J. Cunningham
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Volume:
50
Year:
2002
Language:
english
Pages:
29
DOI:
10.1016/s0022-5096(01)00087-4
File:
PDF, 488 KB
english, 2002
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