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Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds
Paul E.W. Labossiere, Martin L. Dunn, Shawn J. CunninghamVolume:
50
Year:
2002
Language:
english
Pages:
29
DOI:
10.1016/s0022-5096(01)00087-4
File:
PDF, 488 KB
english, 2002