![](/img/cover-not-exists.png)
Modeling sugar cane yield with a process-based model from site to continental scale: uncertainties arising from model structure and parameter values
Valade, A., Ciais, P., Vuichard, N., Viovy, N., Huth, N., Marin, F., Martiné, J.-F.Volume:
7
Language:
english
Journal:
Geoscientific Model Development Discussions
DOI:
10.5194/gmdd-7-1197-2014
Date:
January, 2014
File:
PDF, 10.04 MB
english, 2014