SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose, CA (Sunday 28 January 2007)] Digital Photography III - Digital camera resolution measurement using sinusoidal Siemens stars

Loebich, Christian, Wueller, Dietmar, Klingen, Bruno, Jaeger, Anke, Martin, Russel A., DiCarlo, Jeffrey M., Sampat, Nitin
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Volume:
6502
Year:
2007
Language:
english
DOI:
10.1117/12.703817
File:
PDF, 1.50 MB
english, 2007
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