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Thermal characterization of LDMOS transistors for accelerating stress testing
J.M Bosc, P Dupuy, J Gil, J.M Dorkel, G SarrabayrouseVolume:
31
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0026-2692(00)00054-9
File:
PDF, 347 KB
english, 2000