Reliability physics study for semiconductor-polymer device...

Microelectronics Journal 2003 Vol. 34; Iss. 5-8

Reliability physics study for semiconductor-polymer device development

Dyanna G.D. Teixeira, Jane M.G. Laranjeira, Elder A. de Vasconcelos, Eronides F. da Silva Jr., Walter M. de Azevedo, Helen J. Khoury
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Volume:
34
Year:
2003
Language:
english
Pages:
3
DOI:
10.1016/s0026-2692(03)00109-5
File:
PDF, 103 KB
english, 2003
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