How well can we assess thermally driven reliability issues...

How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002

Yogendra Joshi, Kaveh Azar, David Blackburn, Clemens J.M. Lasance, Ravi Mahajan, Jukka Rantala
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
34
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0026-2692(03)00200-3
File:
PDF, 99 KB
english, 2003
Conversion to is in progress
Conversion to is failed