How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002
Yogendra Joshi, Kaveh Azar, David Blackburn, Clemens J.M. Lasance, Ravi Mahajan, Jukka RantalaVolume:
34
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0026-2692(03)00200-3
File:
PDF, 99 KB
english, 2003